Up to 1200 V automotive-grade SiC MOSFETs in an SMD package with top-side cooling
A new 750 V SiC MOSFET in our HU3PAK package
With a breakdown voltage up to 1200 V, these AEC-Q101 qualified devices combine the intrinsic features of ST's 3rd-generation of silicon-carbide STPOWER technology with the excellent thermal performance of the SMD package with top-side cooling (HU3PAK). Energy efficiency, system size and weight are improved for a smaller form factor and enhanced performance.
Thermal performance
- SMD package with top-side cooling
Power efficiency
- Very low RDS(on) over the entire temperature range
- Very low switching losses
Switching performance
- High-speed switching performance
- Source sensing pin
Easier design
- Very fast and robust intrinsic body diode
Automotive qualification
- AEC-Q101 qualified
| 650 V series | 750 V series | 1200 V series |
---|---|---|---|
Breakdown voltage (VDS) | 650 V | 750 V | 1200 V |
On-state resistance (max) | 63 mΩ , 72 mΩ | 78 mΩ | 28 mΩ , 87 mΩ |
Drain current | 30 A | 30 A | 30 A , 100 A |
Product references |
On-demand webinar
Watch our on-demand webinar to learn how ST’s third generation of silicon-carbide MOSFETs with our new top-side cooling HU3PAK package can take your designs to the next level.
On-demand webinar
In this webinar, we will look closely at different test methods and approaches (double pulse tests, application tests, thermal tests, etc.). In addition to a description of the test platform based on the STDES-SICGPHU3 reference design, our team will provide useful tips on benchmarking power devices to correctly determine SiC performance with real-life use case measurements.
Flyer
3rd-gen SiC MOSFETs feature very low RDS(on) and ensure an extended mileage range, optimized systems size and weight for electric vehicles. Our comprehensive portfolio covers a broad breakdown voltage range up to 1200 V. Devices are offered in state-of-the-art packages designed to meet the highest automotive and industrial standards.
Technical note
This note provide guidelines for package mounting, handling and soldering, as well as thermal considerations linked to heat sink types and assembly methods. It provides information on how to limit the chip's temperature by managing the heat transfer between the chip and the ambient atmosphere to ensure the correct performance of a component and to avoid failure.
SiC devices allow smaller and lighter power designs featuring higher power density