For 60 years, the IRPS has been the premiere conference for engineers and scientists to present new and original work in the area of microelectronics reliability. Drawing participants from the United States, Europe, Asia, and all around the world, the IRPS seeks to understand the reliability of semiconductor devices, integrated circuits, and microelectronic systems, through an improved understanding of the physics of failure and the application environment. The IRPS will allow attendees to increase their knowledge and understanding of microelectronics reliability, and provide an opportunity to meet with colleagues from around the world, and grow their network. STMicroelectronics is a Gold Patron this year, presenting step forwards on microelectronics reliability with three papers, three posters, and a tutorial. Follow us at IRPS, virtually or in person in Dallas!