IRPS 2025

March 30 - April 3, 2025 in Monterey, US

Powering the future of reliable microelectronics.
3 Expert insights. workshops.
10+ Network. experts on site.
10 On stage. presentations & invited talks.

Enabling reliable solutions for a connected world

Join ST at the 2025 IEEE International Reliability Physics Symposium (IRPS), the premiere conference for engineers and scientists to present new and original work in microelectronics reliability.

 

ST is proud to be a gold patron of the 2025 IEEE IRPS edition. Our commitment is further demonstrated by our key leaders who hold various committee roles: Lorenzo Cerati (ESD & latch-up), Fiorella Pozzobon (Reliability testing), Xavier Federspiel (Publicity chair + management comittee), Philippe Roche (Radiation track + management committee).

 

Discover our agenda below and join our experts onsite

Workshops and invited talks

Join ST leaders for insights on ePCM reliability, corrosion in microelectronics, SiC power technologies, and reliability in power packaging.

30

Mar

1:30 PM

1.5h

Workshop | Lorenzo Cerati at | 1.5h

ESD and reliability worlds: analogies and differences

31

Mar

8:30 AM

1h

Workshop | Andrea Redaelli at | 1h

Ge-GST ePCM reliability: an intimate interaction between material properties and device operation

31

Mar

8:30 AM

1h

Workshop | Lucile Broussous at | 1h

Corrosion in µ-electronic devices: an overview from FE manufacturing to product-life & reliability

1

Apr

10:35 AM

30 min

Invited talk | Nicolo Piluso at | 30 min

Influence of starting material on final device in SiC power technologies

3

Apr

10:50 AM

30 min

Invited talk | Riccardo Villa at | 30 min

A comprehensive reliability approach to heterogeneous integration in power packaging

Presentations and posters

Join ST speakers for insightful presentations and posters.

1

Apr

10:35 AM

30 min

Presentation | Luca Oldani at | 30 min

Hot-hole gate current and degradation in n-type lateral drift MOSFETs: characterization and TCAD analysis

1

Apr

1:30 PM

30 min

Presentation | Bassel Ayoub at | 30 min

Investigation into the moisture degradation mechanism of integrated stacks using new moisture sensor design

2

Apr

6:00 PM

3h

Poster presentation | Valentin Viollet at | 3h

Temperature and drift-aware high-level PCM-based array model for reliable hardware IMC design

2

Apr

6:00 PM

3h

Poster presentation | Philippe Roche at | 3h

Reliability qualification challenges and flow for analog qualification test vehicle

Chaired workshops

30

Mar

9:00 AM

1h

Chair | Lucile Broussous at | 1h

GaN power devices; reliability in application

30

Mar

11:00 AM

1h

Chair | Lucile Broussous at | 1h

Fundamentals of circuit aging: from devices to test chips to products

31

Mar

10:30 AM

1h

Chair | Lorenzo Cerati at | 1h

Future automotive mission profiles for the era of software-defined vehicles

31

Mar

1:00 PM

1h

Chair | Philippe Roche at | 1h

Microcircuit reliability management in space ESA missions: from system perspectives down to the EEE component

2

Apr

1:30 PM

1h

Chair | Lorenzo Cerati at | 1h

ESD and latchup

Register for IRPS 2025

Join ST experts at the 2025 IEEE IRPS and explore the advancements in microelectronics reliability!

On

Mar 30 - Apr 03, 2025

In

Monterey, US
Get your pass
Hyatt Regency

Monterey, CA, US

map of IEEE IRPS map of IEEE IRPS Get your pass

Register for IRPS 2025

Join ST experts at the 2025 IEEE IRPS and explore the advancements in microelectronics reliability!

Mar 30 - Apr 03, 2025

Monterey, US

map of IEEE IRPS Get your pass